Two- and three-dimensional methods for inspection and metrology V
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Two- and three-dimensional methods for inspection and metrology V 11-12 September 2007, Boston, Massachusetts, USA by Peisen S. Huang

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Published by SPIE in Bellingham, Wash .
Written in English


Book details:

Edition Notes

Includes bibliographical references and author index.

StatementPeisen S. Huang, editor ; sponsored and published by by SPIE
SeriesProceedings of SPIE -- v. 6762, Proceedings of SPIE--the International Society for Optical Engineering -- v. 6762.
ContributionsSociety of Photo-optical Instrumentation Engineers
Classifications
LC ClassificationsTA1634 .T89 2007
The Physical Object
Pagination1 v. (various pagings) :
ID Numbers
Open LibraryOL24430178M
ISBN 10081946922X
ISBN 109780819469229
LC Control Number2010459246
OCLC/WorldCa184985550

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Two- and Three-Dimensional Methods for Inspection and Metrology III. Editor(s): hide all abstracts. Latest optical methods for industrial dimensional metrology Author(s): Kevin Harding. Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases. Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II. Editor(s): Kevin G. Harding; John W. V. Miller *This item is only available on the SPIE Digital Library. Volume Details. Volume Number: Date Published: 11 February This paper is a revision of a paper presented at the SPIE conference on Two- and Three-Dimensional Methods for Inspection and Metrology V, September , Boston, Massachusetts. The paper presented there appears unrefereed in SPIE Proceedings Vol. 1 Introduction. Two- and Three- dimensional Methods for Inspection and Metrology III: Boston, Oct. , Tao Xian and Murali Subbarao, "Performance evaluation of different depth from defocus (DFD) techniques", Photonics East, SPIE Vol. , Session 3,

Three Dimensional Surface Topography. Book • Filtering techniques are reviewed and the fundamental philosophy and metrological characteristic of each method has been highlighted, and the corresponding theory and algorithm has been briefly introduced. Part V - Applications of three-dimensional surface metrology. Pages Two- and Three- dimensional Methods for Inspection and Metrology III: Boston, Oct. , [pdf] Tao Xian and Murali Subbarao, "Performance evaluation of different depth from defocus (DFD) techniques", Photonics East, SPIE Vol. , Session 3, Recently, digital-image-correlation techniques have been used to accurately determine two-dimensional in-plane displacements and strains. An extension of the two-dimensional method to the acquisition of accurate, three-dimensional surfacedisplacement data from a stereo pair of CCD cameras is presented in this paper. A pin-hole camera model is used to express the transformation relating three. the book, comparators, followed by the metrology of gears, screw threads, and surface finish metrology are discussed. The chapter on miscellaneous metrology talks about laser-based instrumentation and coordinate measuring machines. The last chapter in this section features inspection methods and .

  Get this from a library! Two- and three-dimensional methods for inspection and metrology III: October, , Boston, Massachusetts, USA. [Kevin G Harding; Society of Photo-optical Instrumentation Engineers.;]. J. Mure-Dubois, H. Hügli, in Two- and Three-Dimensional Methods for Inspection and Metrology V, vol. (SPIE, Boston, ) Google Scholar J. Mure-Dubois, H. Hügli, in Proceedings of the ICVS Workshop on Camera Calibration Methods for Computer Vision Systems, CCMVS, .   Two- and three-dimensional methods for inspection and metrology VI: August , San Diego, California, USA.   Part V Applications of Three-Dimensional Surface Metrology In order to be able to present an overall view of the potential applications of three-dimensional (3-D) surface metrology, this Part introduces some examples of practical uses where recently developed 3-D surface measurement and characterization techniques have been used.